Title :
The effect of power islands on delta-I noise, interconnect noise, and timing for wide, on-chip data-buses
Author :
Deutsch, A. ; Smith, H.H. ; Huang, H.M. ; Elfadel, A.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A study is shown of the effect of having breaks in the power distribution on large microprocessor chips. The effect on delta-I noise, interconnect noise, and timing is illustrated through simulation results obtained with representative driver and receiver circuits and guidelines are given on how to minimize the impact of the power islands.
Keywords :
integrated circuit interconnections; integrated circuit noise; microprocessor chips; power supply circuits; delta-I noise; interconnect noise; microprocessor chip; on-chip data-buses; power distribution; power island; receiver circuits; Circuit noise; Circuit simulation; Crosstalk; Driver circuits; Impedance; Integrated circuit interconnections; Noise generators; Power distribution; Rails; Timing;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2005. IEEE 14th Topical Meeting on
Print_ISBN :
0-7803-9220-5
DOI :
10.1109/EPEP.2005.1563765
