Title :
ROBUSTLY SCAN-TESTABLE CMOS SEQUENTIAL CIRCUITS
Author :
Park, Bong-Hee ; Menon, Prem R.
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; FETs; Fault detection; Latches; Robustness; Semiconductor device modeling; Sequential circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519518
