DocumentCode :
2843818
Title :
Temperature effects in circuits using junction transistors
Author :
Lin, H. ; Barco, A.
Author_Institution :
RCA Labs., Princeton, NJ, USA
fYear :
1956
fDate :
16-17 Feb. 1956
Firstpage :
21
Lastpage :
21
Keywords :
Circuits; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1956 IEEE International
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/ISSCC.1956.1154461
Filename :
1154461
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2843818
