Title :
Analysis of turn-off behavior and switching losses of a 1200 V/50 A zero-voltage or zero-current switched IGBT
Author :
Kolar, Johann W. ; Ertl, Hans ; Erhartt, Lutz L. ; Zach, Franz C.
Author_Institution :
Tech. Univ. of Vienna, Austria
fDate :
Sept. 28 1991-Oct. 4 1991
Abstract :
The authors describe the development of the basics for the determination of the maximum obtainable switching frequencies of a 20 kW, 820 V/50 V full-bridge DC-DC converter designed with (second-generation) 1200 V/50 A IGBTs (insulated-gate bipolar transistors). Because the turn-on losses can be almost completely avoided by phase-shift PWM (pulse-width modulation), emphasis is placed on the determination of the turn-off losses. The dependencies of the switching power losses per switching cycle on the load condition and on the junction temperature are investigated for the following cases: simple PWM (switching without snubber), switching with capacitive parallel branch (turn-off snubber network), and force commutation of the power electronic switches using a commutation circuit (zero-current switching). The results obtained indicate the possibility of rating the overall effort linked to a given operating mode of the power electronic devices. The limits of the operating region of the converter system can also be determined.<>
Keywords :
insulated gate bipolar transistors; power convertors; power transistors; pulse width modulation; switching circuits; 1200 V; 20 kW; 50 A; 50 V; 820 V; force commutation; full-bridge DC-DC converter; insulated-gate bipolar transistors; phase-shift PWM; switching frequencies; switching losses; turn-off behavior; zero-current switched IGBT; zero-voltage switched IGBT; DC-DC power converters; Insulated gate bipolar transistors; Insulation; Power electronics; Pulse width modulation; Snubbers; Switching circuits; Switching converters; Switching frequency; Switching loss;
Conference_Titel :
Industry Applications Society Annual Meeting, 1991., Conference Record of the 1991 IEEE
Conference_Location :
Dearborn, MI, USA
Print_ISBN :
0-7803-0453-5
DOI :
10.1109/IAS.1991.178060