DocumentCode
2843943
Title
Frequency domain based friction compensation - Industrial application to transmission electron microscopes -
Author
Rijlaarsdam, D. ; Nuij, P. ; Schoukens, J. ; Steinbuch, M.
Author_Institution
Dept. of Mech. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2011
fDate
June 29 2011-July 1 2011
Firstpage
4093
Lastpage
4098
Abstract
Friction is a performance limiting factor in many industrial motion systems. Correct compensation or control of friction and other nonlinearities is generally difficult. Apart from the complex nature of friction, compensation of even the most basic type of friction, Coulomb friction, is non trivial. Most available tuning methods rely on time domain data and are often unable to distinguish between nonlinear effects of friction and that of for example linear viscous damping. Furthermore, the sensitivity of time domain data to the influence of friction is too low for correct tuning in many of the high precision motion applications currently used in industry. In this paper a frequency domain method is introduced that allows fast and high accuracy tuning of controller parameters when the closed loop system is subject to nonlinear influences. This methodology is applied to optimally compensate friction in a high precision motion stage of a transmission electron microscope. Theoretical and experimental results are presented and related to time domain performance to illustrate the advantage of frequency domain tuning over time domain tuning.
Keywords
closed loop systems; control nonlinearities; frequency-domain analysis; friction; motion compensation; motion control; transmission electron microscopes; Coulomb friction; closed loop system; control nonlinearities; controller tuning; frequency domain method; friction compensation; industrial motion systems; linear viscous damping; nonlinear controller parameters; time domain sensitivity; transmission electron microscopes; Feeds; Frequency domain analysis; Friction; Gain; Harmonic analysis; Time domain analysis; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2011
Conference_Location
San Francisco, CA
ISSN
0743-1619
Print_ISBN
978-1-4577-0080-4
Type
conf
DOI
10.1109/ACC.2011.5990617
Filename
5990617
Link To Document