Title :
Computer-aided design for large-scale integration
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Cathode ray tubes; Design automation; Large scale integration; Logic arrays; Logic design; Logic testing; Metallization; Semiconductor device manufacture; System testing; Wires;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154489
