Title :
THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS
Author :
Henderson, Christopher L. ; Soden, Jerry M. ; Hawkins, Charles F.
Keywords :
CMOS integrated circuits; CMOS logic circuits; Circuit testing; Coupling circuits; Electromigration; Integrated circuit testing; Inverters; Logic circuits; Logic gates; Logic testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519522
