Title :
Complex bilateral finlines: a new analysis
Author :
Fernandes, H.C.C.
Author_Institution :
Dept. of Electr. Eng., Fed. Univ. of Rio Grande Norte
Abstract :
An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneously at the first attempt. Also the concise Transverse Transmission Line-TTL-full wave method is used, in the analysis. New results of the complex propagation and of the characteristic impedance as a function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D
Keywords :
fin lines; permittivity; waveguide theory; attenuation constant; characteristic impedance; complex bilateral finlines; complex propagation; conductivity; conductor thickness; effective dielectric constant; full wave method; semiconductor substrate; transverse transmission line; Attenuation; Boundary conditions; Conductors; Current density; Dielectric constant; Dielectric substrates; Electromagnetic fields; Equations; Finline; Impedance;
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
DOI :
10.1109/ICMMT.1998.768353
