Title :
The potential of integrated electronics for microwave systems
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Keywords :
Beam steering; Degradation; Frequency; Laboratories; Light emitting diodes; Microwave devices; Microwave transistors; Power system reliability; Radar signal processing; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154501