Title :
STUCK FAULT AND CURRENT TESTING COMPARISON USING CMOS CHIP TEST
Author :
Storey, Tom ; Maly, Wojciech ; Andrews, John ; Miske, Myron
Keywords :
CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Logic testing; Performance evaluation; Semiconductor device modeling; Semiconductor device testing; Switches;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519523
