Title :
System/circuit device considerations in the design and development of a D/A and A/D integrated circuits family
Author :
Rudin, M. ; O´Day, R. ; Jenkins, R.
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Aerospace industry; Circuit testing; Data acquisition; Data processing; Displays; Logic; Resistors; Silicon; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154509
