Title :
Electron cyclotron absorption measurements in a Tokamak plasma using the five channel E-band millimeter wave system
Author_Institution :
Inst. of Tech. Phys., Acad. Sinica, Shanghai
Abstract :
Electron cyclotron absorption measurements by a multiple-channel millimeter wave system at the electron gyro-frequency have been used for temporal and spatial determination of the optical thickness and electron pressure in Tokamak devices. The instrumentation and technical aspects are reviewed in this paper
Keywords :
Tokamak devices; electron density; millimetre wave measurement; plasma diagnostics; E-mode; EHF; O-mode; Tokamak devices; Tokamak plasma; electron cyclotron absorption measurements; electron gyro-frequency; electron pressure; instrumentation; millimeter wave system; multiple-channel MM-wave system; optical thickness; Absorption; Cyclotrons; Electrons; Millimeter wave measurements; Plasma devices; Plasma measurements; Plasma waves; Pressure measurement; Thickness measurement; Tokamaks;
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
DOI :
10.1109/ICMMT.1998.768366
