Title :
The muti-port technology for microwave sensing applications
Author :
Haddadi, Kamel ; Lasri, Tuami
Author_Institution :
Institut d´´Electronique, de Microélectronique et de Nanotechnologie (IEMN-DHS), Université Lille 1, UMR CNRS 8520, 59652 Villeneuve d´´Ascq Cedex, France
Abstract :
The multi-port technology has gained much consideration from the research community due to a very broad range of potential applications, such as network analysis, telecommunications or automotive radar sensors. Since recently, this technology attracts also attention for new emerging applications. In particular, this paper presents recent developments of multi-port systems dedicated to microwave sensing applications. This includes new experimental demonstrations of microwave and millimeter-wave multi-port near-field microscopes.
Keywords :
Europe; Image resolution; Impedance; Microwave measurements; Microwave propagation; microwave sensing; multi-port; near-field microwave microscopy; non-destructive testing; six-port;
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2012.6258266
