DocumentCode
2844549
Title
The muti-port technology for microwave sensing applications
Author
Haddadi, Kamel ; Lasri, Tuami
Author_Institution
Institut d´´Electronique, de Microélectronique et de Nanotechnologie (IEMN-DHS), Université Lille 1, UMR CNRS 8520, 59652 Villeneuve d´´Ascq Cedex, France
fYear
2012
fDate
17-22 June 2012
Firstpage
1
Lastpage
3
Abstract
The multi-port technology has gained much consideration from the research community due to a very broad range of potential applications, such as network analysis, telecommunications or automotive radar sensors. Since recently, this technology attracts also attention for new emerging applications. In particular, this paper presents recent developments of multi-port systems dedicated to microwave sensing applications. This includes new experimental demonstrations of microwave and millimeter-wave multi-port near-field microscopes.
Keywords
Europe; Image resolution; Impedance; Microwave measurements; Microwave propagation; microwave sensing; multi-port; near-field microwave microscopy; non-destructive testing; six-port;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location
Montreal, QC, Canada
ISSN
0149-645X
Print_ISBN
978-1-4673-1085-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2012.6258266
Filename
6258266
Link To Document