Title :
Charge-control characterization of field-effect transistors
Author :
Boothroyd, A. ; Burgess, J.
Author_Institution :
Queen´´s University, Belfast, Ireland
Keywords :
Capacitance; Circuit testing; Conducting materials; Displacement measurement; FETs; Probes; Pulse circuits; Q measurement; Voltage control;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154515
