DocumentCode

2844605

Title

Charge-control characterization of field-effect transistors

Author

Boothroyd, A. ; Burgess, J.

Author_Institution

Queen´´s University, Belfast, Ireland

Volume

X

fYear

1967

fDate

15-17 Feb. 1967

Firstpage

86

Lastpage

87

Keywords

Capacitance; Circuit testing; Conducting materials; Displacement measurement; FETs; Probes; Pulse circuits; Q measurement; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1967.1154515

Filename

1154515