Title :
Silicon on sapphire complementary MOS memory systems
Author :
Allison, J. ; Burns, Jack ; Heiman, F.
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Keywords :
Capacitance; Circuits; Delay; Flip-flops; Laboratories; MOSFETs; Power dissipation; Semiconductor films; Silicon; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1967.1154522
