Title :
Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits
Author :
Kole, Dipak K. ; Rahaman, Hafizur ; Das, Debesh K. ; Bhattacharya, Bhargab B.
Author_Institution :
Inf. Technol. Dept., Bengal Eng. & Sci. Univ., Shibpur, India
Abstract :
This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.
Keywords :
automatic testing; logic design; logic testing; quantum gates; automatic test set derivation; benchmark circuits; k-CNOT gates; multiple missing gate fault; partial missing-gate fault detection; reversible quantum circuit; single missing gate fault; test set generation; Arrays; Benchmark testing; Bipartite graph; Circuit faults; Integrated circuit modeling; Logic gates; Vectors; Missing-gate faults; quantum computing; reversible logic; testable design; universal test set;
Conference_Titel :
Electronic System Design (ISED), 2011 International Symposium on
Conference_Location :
Kochi, Kerala
Print_ISBN :
978-1-4577-1880-9
DOI :
10.1109/ISED.2011.69
