DocumentCode
2844773
Title
Threshold Read Method for Multi-bit Memristive Crossbar Memory
Author
Yilmaz, Yalcin ; Mazumder, Pinaki
Author_Institution
Electr. Eng. & Comput. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2011
fDate
19-21 Dec. 2011
Firstpage
217
Lastpage
222
Abstract
Memristors have raised great interest in various logic and non-volatile memory applications. They are especially a good candidate for crossbar memory applications for their capability of being integrated in high densities and low switching power consumptions. In this paper we propose a novel read/write circuitry for memristive crossbar memories that enables reliable multilevel data storage in single cell while eliminating the use of reference resistors thus reducing the number of comparisons required. The proposed method can be used independent of the nonlinear characteristics of the memristive device and it can also be utilized by memory cells incorporating a memristor and series diodes.
Keywords
CMOS memory circuits; memristors; random-access storage; resistors; low switching power consumption; memory cell; multibit memristive crossbar memory; nonlinear characteristics; nonvolatile memory application; read-write circuitry; reliable multilevel data storage; series diode; threshold read method; Computer architecture; Immune system; Memristors; Microprocessors; Resistance; Threshold voltage; crossbar memory; memristor; multi-state memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System Design (ISED), 2011 International Symposium on
Conference_Location
Kochi, Kerala
Print_ISBN
978-1-4577-1880-9
Type
conf
DOI
10.1109/ISED.2011.68
Filename
6117354
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