• DocumentCode
    2844773
  • Title

    Threshold Read Method for Multi-bit Memristive Crossbar Memory

  • Author

    Yilmaz, Yalcin ; Mazumder, Pinaki

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2011
  • fDate
    19-21 Dec. 2011
  • Firstpage
    217
  • Lastpage
    222
  • Abstract
    Memristors have raised great interest in various logic and non-volatile memory applications. They are especially a good candidate for crossbar memory applications for their capability of being integrated in high densities and low switching power consumptions. In this paper we propose a novel read/write circuitry for memristive crossbar memories that enables reliable multilevel data storage in single cell while eliminating the use of reference resistors thus reducing the number of comparisons required. The proposed method can be used independent of the nonlinear characteristics of the memristive device and it can also be utilized by memory cells incorporating a memristor and series diodes.
  • Keywords
    CMOS memory circuits; memristors; random-access storage; resistors; low switching power consumption; memory cell; multibit memristive crossbar memory; nonlinear characteristics; nonvolatile memory application; read-write circuitry; reliable multilevel data storage; series diode; threshold read method; Computer architecture; Immune system; Memristors; Microprocessors; Resistance; Threshold voltage; crossbar memory; memristor; multi-state memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System Design (ISED), 2011 International Symposium on
  • Conference_Location
    Kochi, Kerala
  • Print_ISBN
    978-1-4577-1880-9
  • Type

    conf

  • DOI
    10.1109/ISED.2011.68
  • Filename
    6117354