DocumentCode :
2844879
Title :
Reliability of High Temperature Inverters for HEV
Author :
Renken, F. ; Ehbauer, G. ; Karrer, V. ; Knorr, R. ; Ramminger, S. ; Seliger, N. ; Wolfgang, E.
Author_Institution :
Siemens VDO Automotive, Regensburg
fYear :
2007
fDate :
2-5 April 2007
Firstpage :
563
Lastpage :
568
Abstract :
The requirements for the reliability of electronic circuits becomes constantly higher. Therefore, in particular, the strongly growing automotive industry will be influenced, where the number of electronic circuits and the installed power is constantly increasing. Meanwhile for example a hybrid vehicle can be powered by an electrical system with more than 100 kW. The increasing power density of these circuits and the use of the components at higher ambient temperatures lead to the fact that the electronic components will heat up more and more. Additionally the further integration of electronic components requires a higher reliability of single semiconductors. With higher complexity it is more and more a challenge to prove the total reliability of these circuits by accelerated tests. Siemens has been working on the reliability of high temperature applications for years. This article describes a simulation concept, which calculates the crack propagation speed of bond and solder joint connections. Input parameters for the simulation are: Material properties, geometry and different stress types as current loads or temperature. This procedure is demonstrated on the basis of the power electronics for a hybrid drive system.
Keywords :
automotive electronics; circuit reliability; cracks; hybrid electric vehicles; invertors; automotive industry; crack propagation; high temperature inverter reliability; hybrid electric vehicle; material properties; power electronics; solder joint connections; Automotive engineering; Circuit simulation; Circuit testing; Electronic circuits; Electronic components; Hybrid electric vehicles; Integrated circuit reliability; Inverters; Power system reliability; Temperature; High temperature electronics; Hybrid electrical vehicle (HEV); Life time prognosis; Power electronic devices; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Conversion Conference - Nagoya, 2007. PCC '07
Conference_Location :
Nagoya
Print_ISBN :
1-4244-0844-X
Electronic_ISBN :
1-4244-0844-X
Type :
conf
DOI :
10.1109/PCCON.2007.373022
Filename :
4239212
Link To Document :
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