Title :
Metrics applied to Aspect Oriented Design using UML profiles
Author :
Debnath, N. ; Baigorria, L. ; Riesco, D. ; Montejano, G.
Author_Institution :
Dept. of Comput. Sci., Winona State Univ., Winona, MN
Abstract :
The aspect oriented design (AOD) surges from the continuous search of improving the software systems development. The AOD is a methodology that emerges from the aspect oriented programming (AOP), which intents to improve the concerns of the components in software programming; this methodology is based on existing technologies like object oriented (OO). Calculate the resources, is an activity that can improve the software development, because of this there are a big amount of investigation made on metrics. There is a great quantity of works about metrics applied to OO design but a few about metrics applied to AOD. Software´s metrics are ways of qualify the software designs. The application of metrics is essential to qualify the effectiveness of AOD. AOD is a methodology based OO therefore we can applied some metrics traditionally for OO design. This paper shows the definition of the C&K metrics applied to AOD using UML profiles.
Keywords :
Unified Modeling Language; object-oriented programming; software metrics; UML profiles; aspect oriented design; aspect oriented programming; object oriented programming; software design quality; software metrics; software programming; software systems development; Application software; Computer science; Object oriented modeling; Object oriented programming; Packaging; Software design; Software metrics; Software systems; Surges; Unified modeling language; Aspect Oriented; Aspect Oriented Metrics; C&K Metrics; Metrics; OCL; UML Profile: AO;
Conference_Titel :
Computers and Communications, 2008. ISCC 2008. IEEE Symposium on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-2702-4
Electronic_ISBN :
1530-1346
DOI :
10.1109/ISCC.2008.4625764