DocumentCode

2845101

Title

Silicon versus germanium in picosecond logic circuits

Author

Hill, F. ; Farber, Alex ; Yu, Haoyong

Author_Institution

IBM Corporation, Yorktown Heights, NY, USA

Volume

X

fYear

1967

fDate

15-17 Feb. 1967

Firstpage

112

Lastpage

113

Keywords

Circuit testing; Delay effects; Germanium; Logic circuits; Packaging; Silicon; Switches; Switching circuits; Thin film transistors; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1967.1154543

Filename

1154543