• DocumentCode
    2845108
  • Title

    Evaluation of the impact of view differentiation and backprojection weight in circle-plus-line cone-beam tomography

  • Author

    Hoppe, Stefan ; Dennerlein, Frank ; Lauritsch, Günter ; Hornegger, Joachim ; Noo, Frédéric

  • Author_Institution
    Univ. of Erlangen-Nuremberg, Erlangen
  • Volume
    6
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    4097
  • Lastpage
    4102
  • Abstract
    Recently, we proposed a new view differentiation scheme for analytical cone-beam reconstruction formulae that demonstrated a strong robustness to changes in the data acquisition geometry and to coarse view sampling, unlike former differentiation schemes. We incorporated this new scheme into the Katsevich reconstruction formula for the circle-plus-line trajectory. We also implemented an alternative Katsevich formula for the same trajectory, where the view differentiation step was eliminated by using integration by parts. This work evaluates both formulae in terms of resolution performance, noise performance, visual image quality and computational effort. We also evaluate the impact of the z-sampling on the line segment. Experiments are presented from simulated cone-beam data. The experiments show that the view differentiation approach with the new view differentiation scheme achieves similar image quality as the integration-by-part approach while being at the same time much more efficient.
  • Keywords
    computerised tomography; data acquisition; Katsevich reconstruction formula; backprojection; circle-plus-line cone-beam tomography; data acquisition; view differentiation; z-sampling; Computational modeling; Data acquisition; Geometry; Image quality; Image reconstruction; Image resolution; Image segmentation; Robustness; Sampling methods; Tomography; Cone-Beam Reconstruction; Integration by Parts; View Differentiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437025
  • Filename
    4437025