DocumentCode :
2845123
Title :
A Sub-Micro Pattern Analysis for Local Rotation, Gray-Scale Transformation and Gaussian Noise Invariant Texture Descriptors
Author :
Srisuk, Sanun
Author_Institution :
Dept. of Comput. Eng., Mahanakorn Univ. of Technol., Bangkok, Thailand
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
112
Lastpage :
117
Abstract :
A new rotation invariant texture descriptor based on the difference of offset Gaussian (DooG) and a sub-micro pattern encoding are proposed. We first apply the Gabor wavelet to texture images. We then utilize the DooG to measure the difference between the center positive Gaussian and the neighbor rotated negative one. We encode the local micro texture using our proposed method, a sub-micro pattern analysis. In classification step, we convert the rotation problem to the circular shift one by applying the Trace transform on the encoding image to get another 2D image and then compute the circular shift invariant features in the Trace transform. A k-nearest neighbor classifier is employed to classify the shift invariant features. The proposed method is local rotation invariant texture descriptor and is robust to the additive Gaussian noise as a result of adapting the DooG. We evaluate the proposed method on the Brodatz album with respect to rotation and Gaussian noise. Experimental results have shown that our proposed method outperforms the recent texture analysis methods.
Keywords :
Gaussian noise; image classification; image coding; image colour analysis; image texture; transforms; Brodatz album; Gabor wavelet; Gaussian noise invariant texture descriptor; Trace transform; additive Gaussian noise; circular shift invariant feature; difference of offset Gaussian; gray-scale transformation; image encoding; image texture; k-nearest neighbor classifier; local rotation; rotation invariant texture descriptor; submicro pattern analysis; submicro pattern encoding; Encoding; Gabor filters; Gaussian noise; Gray-scale; Image texture analysis; Kernel; Pattern analysis; Rotation measurement; Wavelet analysis; Wavelet transforms; sub-micro pattern analysis; texture analysis; trace transform; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia, 2009. ISM '09. 11th IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-5231-6
Electronic_ISBN :
978-0-7695-3890-7
Type :
conf
DOI :
10.1109/ISM.2009.26
Filename :
5365033
Link To Document :
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