DocumentCode
2845137
Title
A probe system for microwave characterization of transistor chips
Author
Pan, J-J. ; Cooke, H.
Author_Institution
Texas Instruments, Inc., Dallas, TX, USA
Volume
X
fYear
1967
fDate
15-17 Feb. 1967
Firstpage
104
Lastpage
105
Keywords
Bonding; Coaxial components; Dielectric measurements; Frequency; Microstrip; Microwave transistors; Noise figure; Packaging; Probes; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1967.1154546
Filename
1154546
Link To Document