Title :
Dispersion and impedance calculation of helix slow-wave-structure
Author :
Liang, Chai Ming ; You, Chen Qing
Author_Institution :
Vacuum Electron. Res. Inst., Beijing, China
Abstract :
Based on electromagnetic theory and rigorous tape-model analysis, the effects on dispersion and coupling impedance of tape thickness, tape width, dielectric rod, metal vane and shield barrel in the helix slow-wave circuit are considered simultaneously. The results presented here are more accurate than those given by the sheath model and matched fairly well with experimental ones obtained by cold measurement
Keywords :
dispersion (wave); electric impedance; electromagnetic field theory; slow wave structures; coupling impedance; dielectric rod; dispersion calculation; electromagnetic theory; helix slow-wave-structure; impedance calculation; metal vane; shield barrel; tape thickness; tape width; tape-model analysis; Blades; Coaxial components; Conducting materials; Conductivity; Dielectric materials; Dispersion; Erbium; Impedance; Permittivity; Propagation constant;
Conference_Titel :
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4308-5
DOI :
10.1109/ICMMT.1998.768405
