DocumentCode
2845153
Title
Dispersion and impedance calculation of helix slow-wave-structure
Author
Liang, Chai Ming ; You, Chen Qing
Author_Institution
Vacuum Electron. Res. Inst., Beijing, China
fYear
1998
fDate
1998
Firstpage
779
Lastpage
782
Abstract
Based on electromagnetic theory and rigorous tape-model analysis, the effects on dispersion and coupling impedance of tape thickness, tape width, dielectric rod, metal vane and shield barrel in the helix slow-wave circuit are considered simultaneously. The results presented here are more accurate than those given by the sheath model and matched fairly well with experimental ones obtained by cold measurement
Keywords
dispersion (wave); electric impedance; electromagnetic field theory; slow wave structures; coupling impedance; dielectric rod; dispersion calculation; electromagnetic theory; helix slow-wave-structure; impedance calculation; metal vane; shield barrel; tape thickness; tape width; tape-model analysis; Blades; Coaxial components; Conducting materials; Conductivity; Dielectric materials; Dispersion; Erbium; Impedance; Permittivity; Propagation constant;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology Proceedings, 1998. ICMMT '98. 1998 International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-4308-5
Type
conf
DOI
10.1109/ICMMT.1998.768405
Filename
768405
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