DocumentCode

2845189

Title

An integrated threshold gate

Author

Amodei, J. ; Winder, R. ; Hampel, D. ; Mayhew, T.

Author_Institution

RCA Laboratories, Princeton, NJ, USA

Volume

X

fYear

1967

fDate

15-17 Feb. 1967

Firstpage

114

Lastpage

115

Keywords

Aging; Circuit noise; Integrated circuit synthesis; Laboratories; Logic design; Noise level; Packaging; Resistors; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1967 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1967.1154549

Filename

1154549