DocumentCode :
2845724
Title :
Dear 2011 American control conference attendees and contributors
Author :
Shoureshi, Rahmat A.
Author_Institution :
New York Institute of Technology (NYIT), Northern Boulevard Old, Westbury, 11568-8000, USA
fYear :
2011
fDate :
June 29 2011-July 1 2011
Firstpage :
1
Lastpage :
1
Abstract :
On behalf of the American Control Automatic Council (A2C2) and the 2011 ACC Organizing Committee I would like to welcome you to this year´s American Control Conference being held at the San Francisco Hilton hotel during June 29 to July 1, 2011. Following the tradition set forth by previous ACCs, this year´s conference has attracted about 1500 attendees representing industry, academia, and government agencies, as well as students with deep interest in Control Systems and Automation from across a wide variety of application areas. Through extensive and in-depth review of many high quality submitted papers, containing state of the art research and applications in the Automatic Control area, the Program Committee members accepted about 900 papers which have been organized into 18 daily parallel sessions, three special industry sessions, and two special educational sessions.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2011
Conference_Location :
San Francisco, CA
ISSN :
0743-1619
Print_ISBN :
978-1-4577-0080-4
Type :
conf
DOI :
10.1109/ACC.2011.5990722
Filename :
5990722
Link To Document :
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