DocumentCode

2845992

Title

Reliability of compound semiconductor workshop historical review

Author

Roesch, William J.

fYear

2005

fDate

Oct. 30, 2005

Firstpage

1

Lastpage

16

fLanguage

English

Publisher

ieee

Conference_Titel

ROCS Workshop, 2005. [Reliability of Compound Semiconductors]

Print_ISBN

0-7908-0106-X

Type

conf

DOI

10.1109/ROCS.2005.201549

Filename

1563933