• DocumentCode
    2846079
  • Title

    Improvement of the imaging resolution for a Compton camera by determination of the interaction depth in a 25-segmented germanium detector

  • Author

    Jung, Hyo Soon ; Lee, Ju Hahn ; Kwon, Young Kwan ; Seo, Hee ; Kim, Chan Hyeong ; Lee, Chun Sik

  • Author_Institution
    Chung-Ang Univ., Seoul
  • Volume
    6
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    4364
  • Lastpage
    4366
  • Abstract
    The imaging resolution in a Compton camera depends mainly on the position uncertainty, which is affected by the size of electrodes in a detector. Therefore, if any other method is not used for the reduction of the position uncertainty, the imaging resolution is limited by the size of electrodes. Recently, we have developed a Compton camera consisting of a double-sided silicon strip detector (DSSD) and a 25-segmented germanium detector (25-SEGD). The 25-SEGD has an active volume of 5 x 5 x 2 cm3. We have performed measurement for determination of the interaction depth in the 25-SEGD using the pulse shape analysis. After getting a rise-time correlation between the anode and the segment, we obtained a relation formula between the rise-time of the detector signal and the depth derived from the decay equation of gamma-ray in the detector. This decay formula has been used for the determination of interaction depth. As a result of applying the relation function to image reconstruction, we could improve the imaging resolution.
  • Keywords
    Compton effect; elemental semiconductors; gamma-ray applications; germanium; sensors; 25-segmented germanium detector; Compton camera; Ge-Si; double-sided silicon strip detector; gamma-ray imaging devices; imaging resolution; pulse shape analysis; Cameras; Electrodes; Gamma ray detection; Gamma ray detectors; Germanium; Image resolution; Pulse measurements; Shape measurement; Silicon; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437080
  • Filename
    4437080