Singhal, S. ; Li, T. ; Chaudhari, A. ; Hanson, A.W. ; Therrien, R. ; Johnson, J.W. ; Nagy, W. ; Marquart, J. ; Rajagopal, P. ; Piner, E.L. ; Linthicum, K.J.
fYear :
2005
fDate :
Oct. 30, 2005
Firstpage :
135
Lastpage :
149
Keywords :
Chemical technology; Fingers; Gallium nitride; Gold; HEMTs; Life testing; MODFETs; Packaging; Radio frequency; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
