DocumentCode
2846187
Title
Reliability testing of an lna with 0.18 μm gate process
Author
Jen, Hei-Ruey H. ; Ersland, Peter ; Gil, Carlos ; Lung, Shiou ; Chu, Grace
fYear
2005
fDate
Oct. 30, 2005
Firstpage
157
Lastpage
162
Keywords
Current measurement; Degradation; Diodes; Electrostatic discharge; Performance evaluation; Phase change materials; Stress; Testing; Vehicles; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN
0-7908-0106-X
Type
conf
DOI
10.1109/ROCS.2005.201563
Filename
1563947
Link To Document