Title :
Reliability of E/D PHEMT process for control circuit applications
Author :
Yang, Xinxing ; Ersland, Peter
Keywords :
Circuit testing; FETs; Life testing; Logic circuits; Logic testing; PHEMTs; Performance evaluation; Process control; Switches; Temperature;
Conference_Titel :
ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
Print_ISBN :
0-7908-0106-X
DOI :
10.1109/ROCS.2005.201566
