• DocumentCode
    2846252
  • Title

    [Back cover]

  • fYear
    2005
  • fDate
    30-30 Oct. 2005
  • Firstpage
    169
  • Lastpage
    169
  • Abstract
    Presents the back cover of the proceedings.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ROCS Workshop, 2005. [Reliability of Compound Semiconductors]
  • Conference_Location
    Indian Wells, CA, USA
  • Print_ISBN
    0-7908-0106-X
  • Type

    conf

  • DOI
    10.1109/ROCS.2005.201567
  • Filename
    1563951