DocumentCode
2846582
Title
System evaluation for in vivo imaging of amyloid beta plaques in a mouse brain using statistical tecision theory
Author
Shokouhi, Sepideh ; Wilson, Donald W. ; Pham, Wellington ; Peterson, Todd E.
Author_Institution
Vanderbilt Univ., Nashville
Volume
6
fYear
2007
fDate
Oct. 26 2007-Nov. 3 2007
Firstpage
4528
Lastpage
4530
Abstract
We have developed a method that can be used to assess high resolution imaging systems for relevant molecular imaging applications that require a good combination of spatial resolution and sensitivity. The in-vivo imaging of Amyloid Beta plaques, which are characteristic in the neuropathology of Alzheimer disease, in the brain of a mouse has proven to be a major challenge in current research due to their heterogeneous structure of micro-scale range (les 100 mum). Detecting these plaques or changes in their size and distribution by an ideal observer of the data from an imaging system can be employed as a figure of merit to optimize the hardware configuration of that imaging system for this important application. This method can be implemented on the raw data and does not require image reconstruction studies. We have derived a test statistic for the binary detection task that employs a stochastic object model to describe these plaques. The parameters of the object model were obtained from in-vitro plaque images.
Keywords
brain; decision theory; diseases; image resolution; single photon emission computed tomography; stochastic processes; Alzheimer disease; SPECT; amyloid beta plaques; binary detection task; heterogeneous structure; high-resolution imaging systems; in vivo imaging; in-vitro plaque images; molecular imaging; mouse brain; neuropathology; spatial resolution; statistical decision theory; stochastic object model; Alzheimer´s disease; Hardware; High-resolution imaging; Image reconstruction; In vivo; Mice; Molecular imaging; Spatial resolution; Statistical analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location
Honolulu, HI
ISSN
1095-7863
Print_ISBN
978-1-4244-0922-8
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2007.4437116
Filename
4437116
Link To Document