DocumentCode :
2846703
Title :
Multi-channel data-clock-recovery unit in a CMOS macrocell design
Author :
Kuruvilla, Sibi ; Tang, Yan-zeng
Author_Institution :
Lucent Technol., Allentown, PA, USA
fYear :
1999
fDate :
1999
Firstpage :
103
Lastpage :
108
Abstract :
A multi-channel data-clock-recovery circuit has been implemented in 3.3 V 0.35 μm CMOS technology capable of terminating up to 24 channels at both 65 MHz and 32 MHz. The macrocell contains a manually tuned full-custom analog clock-synthesizer, a standard-cell digital clock-recovery block and testability blocks. The discussion focuses on back-end design methodology: various CAD tools utilized for simulating and integrating device-level and gate-level models, physical layout issues, verification and production-test strategy with an emphasis on design practices to support reuse and adaptability that are core concepts of a macrocell design methodology. Test chips were made to evaluate the macro which is now being used in ASICs
Keywords :
CMOS integrated circuits; cellular arrays; circuit CAD; circuit tuning; design for testability; integrated circuit design; mixed analogue-digital integrated circuits; synchronisation; 0.35 micron; 3.3 V; 32 MHz; 65 MHz; ASICs; CAD tools; CMOS macrocell design; back-end design methodology; gate-level models; macrocell design methodology; manually tuned full-custom analog clock-synthesizer; multi-channel data-clock-recovery unit; physical layout issues; production-test strategy; standard-cell digital clock-recovery block; testability blocks; verification; Application specific integrated circuits; CMOS technology; Circuit simulation; Circuit testing; Clocks; Design automation; Design methodology; Macrocell networks; Monitoring; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signal Design, 1999. SSMSD '99. 1999 Southwest Symposium on
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-5510-5
Type :
conf
DOI :
10.1109/SSMSD.1999.768600
Filename :
768600
Link To Document :
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