Title :
Transistor Schottky-Barrier diode integrated-logic circuit
Author :
Tarui, Yoichiro ; Hayashi, Yasuhiro ; Teshima, Hidekazu ; Sekigawa, Toshihiro
Author_Institution :
Electrotechnical Laboratory, Tokyo, Japan
Keywords :
Capacitance; Circuit noise; Clamps; Electrodes; Laboratories; Logic circuits; Noise figure; Schottky diodes; Temperature measurement; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154646
