Title :
Emission spectra of LSO and LYSO crystals excited by UV light, x-ray and γ-ray
Author :
Zhang, Liyuan ; Mao, Rihua ; Zhu, Ren-Yuan
Author_Institution :
California Inst. of Technol., Pasadena
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
Because of their high stopping power (Xo = 1.14 cm RMoiiere = 2.07 cm) and fast (~40 ns) bright (4 times of BGO) scintillation, cerium doped lutetium oxyorthosilicate (LSO) and cerium doped lutetium-yttrium oxyorthosilicate (LYSO) crystals have attracted a broad interest in the high energy physics community. This paper presents a comparative study on emission spectra measured for large size BGO, lead tungstate (PbWO4) LYSO and LSO samples excited by UV light (photo-luminescence), x-ray (x- luminescence) and gamma-ray (radio-luminescence). A red shift was observed between the x-luminescence and the radio-luminescence versus the surface photo-luminescence, which can be explained by internal absorption. Additional red shift and significant red component was observed in the radio-luminescence spectra measured for LSO samples. This is the only significant difference we observed between the large size LSO and LYSO samples. The origin of these red shifts and the consequence to their light output and applications in the high energy and nuclear physics experiments are elaborated.
Keywords :
cerium; lutetium compounds; optical materials; photoluminescence; spectral line shift; ultraviolet spectra; visible spectra; yttrium compounds; Lu2(1-x)Y2xSiO5:Ce; Lu2SiO5:Ce; cerium doped lutetium oxyorthosilicate crystals; cerium doped lutetium-yttrium oxyorthosilicate crystals; emission spectra; radio-luminescence spectra; red shift; surface photo-luminescence; x-luminescence; Annealing; Cerium; Crystals; Lead; Molecular imaging; Nuclear and plasma sciences; Production facilities; Research and development; Solid scintillation detectors; US Department of Energy;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4437128