• DocumentCode
    2846796
  • Title

    Development of the fully-depleted thick back- illuminated CCD by Hamamatsu

  • Author

    Suzuki, H. ; Muramatsu, M. ; Yamamoto, K. ; Miyazaki, S. ; Kamata, Y.

  • Author_Institution
    Hamamatsu Photonics K.K., Hamamatsu
  • Volume
    6
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    4581
  • Lastpage
    4585
  • Abstract
    We developed the fully-depleted thick back- illuminated CCD fabricated on N-type silicon wafer in collaboration with National Astronomical Observatory of Japan (NAOJ) for a next generation instrument for Subaru Telescope: a very wide-field CCD camera which named Hyper Suprime-Cam (HSC). The CCD format is 4-side buttable, 2 ktimes4 k 15 mum square pixels with 4 low noise output amplifiers. The optimization process was successfully completed. The recent evaluation results showed the charge transfer efficiency (>0.999995), the full-well capacity (>150 ke-), the charge conversion efficiency (5 muV/e-), the low dark(<5e-/pixel/hour at -100degC) and low noise (<5e- at 130 kHz readout, -100degC), high near-infrared QE (40% at lambda=1000 nm) and good surface flatness (15-20 mum). Owing to the new process factory of Hamamatsu, the CCD has the good cosmetics. These results are promising for HSC which requires more than 100 CCDs.
  • Keywords
    amplifiers; charge exchange; position sensitive particle detectors; semiconductor counters; CCD camera; HSC; Hamamatsu; Hyper Suprime-Cam; N-silicon wafer; NAOJ; National Astronomical Observatory of Japan; Subaru telescope; amplifiers; charge transfer efficiency; cosmetics; optimization process; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Collaboration; Instruments; Low-noise amplifiers; Observatories; Production facilities; Silicon; Telescopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437129
  • Filename
    4437129