Title :
Low temperature operation of Ge picosecond logic circuits
Author_Institution :
IBM Corp., Yorktown Heights, NY, USA
Keywords :
Atherosclerosis; Cooling; Delay; Diodes; Germanium; Logic circuits; Silicon; Switches; Temperature dependence; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154650
