Title :
Characterization of ion-implanted avalanche diode oscillators
Author :
Ying, Rendong ; Mankarious, R. ; English, D. ; Bower, R. ; Coerver, L.
Author_Institution :
Huges Research Laboratories, Newport Beach, CA, USA
Keywords :
Annealing; Diodes; Ion implantation; Low-frequency noise; Noise measurement; Oscillators; P-n junctions; Passivation; Silicon; Temperature measurement;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1968 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1968.1154655
