Title :
A study of GEM foils produced at Tech-Etch
Author :
Azmoun, B. ; Caccavano, A. ; Crary, D. ; Herstoff, J. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Saini, G. ; Sinsheimer, J. ; Simon, F. ; Smirnov, N. ; Surrow, B. ; Woody, C.
Author_Institution :
Brookhaven Nat. Lab., Upton
fDate :
Oct. 26 2007-Nov. 3 2007
Abstract :
Tech-Etch is a manufacturing company that produces numerous types of flexible circuits and precision photo- etched parts for industrial use. They have developed the capability for producing GEM foils which can be used in a variety of research or commercial applications. We have studied a number of GEM foils produced at Tech-Etch and compared their properties and performance to GEM foils produced at CERN and by other manufacturers. Results will be reported on their gain characteristics, gain stability and uniformity, and rate dependence compared to other foils, and on their performance as actual tracking detectors in a test beam environment.
Keywords :
electron multiplier detectors; foils; particle tracks; position sensitive particle detectors; CERN; GEM foils; gain stability; gas electron multipliers; photo-etched parts; tech-etch foils; tracking detectors; Detectors; Etching; Flexible manufacturing systems; Flexible printed circuits; Geometry; Manufacturing industries; Nuclear physics; Performance gain; Production; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4437142
