Title :
52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics [Table of Contents]
Abstract :
Presents the table of contents from the proceedings.
Keywords :
CAD; automatic testing; active device measurement; automated component measurement; automatic RF technique; computer aided design; computer aided test; high frequency design; high speed electronics; measurement standard; simulation; wireless system;
Conference_Titel :
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.768619
