• DocumentCode
    2847022
  • Title

    52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics [Table of Contents]

  • fYear
    1998
  • fDate
    3-4 Dec. 1998
  • Abstract
    Presents the table of contents from the proceedings.
  • Keywords
    CAD; automatic testing; active device measurement; automated component measurement; automatic RF technique; computer aided design; computer aided test; high frequency design; high speed electronics; measurement standard; simulation; wireless system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
  • Conference_Location
    Rohnert Park, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1998.768619
  • Filename
    768619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2847022