Title :
Characterization of a pin-TWA photoreceiver in OOK-system experiments up to 112 Gb/s
Author :
Schubert, C. ; Li, J. ; Bach, H.-G. ; Mekonnen, G.G. ; Makon, R.E. ; Derksen, R.H. ; Hurm, V. ; Djupsjöbacka, A. ; Chacinski, M. ; Westergren, U. ; Steffan, A.G. ; Driad, R.
Author_Institution :
Fraunhofer Heinrich-Hertz-Inst., Berlin, Germany
Abstract :
A high-speed pin-TWA photoreceiver, comprising a photodiode and a travelling-wave amplifier, monolithically integrated on a single InP chip, are characterized in OOK system experiments. Error-free performance below the FEC limit is achieved in back-to-back measurements up to 112 Gb/s.
Keywords :
amplitude shift keying; high-speed optical techniques; indium compounds; integrated optics; optical receivers; photodiodes; travelling wave amplifiers; FEC limit; InP; OOK-system; error-free performance; high-speed pin-TWA photoreceiver; monolithical integration; photodiode; single InP chip; travelling-wave amplifier; Bit error rate; High speed optical techniques; Optical amplifiers; Optical attenuators; Optical noise; Optical receivers; Optical transmitters;
Conference_Titel :
Optical Communication (ECOC), 2010 36th European Conference and Exhibition on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-8536-9
Electronic_ISBN :
978-1-4244-8534-5
DOI :
10.1109/ECOC.2010.5621372
