DocumentCode
2847071
Title
Applications of an envelope simulator
Author
Howard, A.
Author_Institution
Application Dev. Group, Hewlett-Packard Co., Santa Rosa, CA, USA
fYear
1998
fDate
3-4 Dec. 1998
Firstpage
39
Lastpage
54
Abstract
There are many applications of the Circuit Envelope simulator. Primarily it is used for efficiently simulating non-steady-state, digitally-modulated RF signals and transient RF signals that are found in many communications circuits and systems. Amplifier adjacent-channel power ratio, error vector magnitude, power added efficiency, frequency or phase versus time, etc. can be simulated. Transient responses of phase locked loops and automatic gain control loops can also be simulated. IQ modulators can be simulated efficiently with baseband modulation signals or sine wave inputs. The performance of receivers with modulated input signals can be simulated as well. Designers are no longer forced to characterize their circuits with unmodulated sine waves. Now, performance can be simulated with the digitally-modulated signals that the circuits will see in operation. Here is a list of typical applications: amplifier adjacent-channel power ratio (ACPR), error vector magnitude (EVM) and power-added efficiency (PAE) with modulated signals; phase locked loop (PLL) simulations: frequency-versus-time transient responses, reference oscillator feedthrough and time-domain noise simulation; I-Q modulator simulations: ACPR, EVM, baseband-to-RF signal mapping, intermodulation distortion; receiver simulation with modulated signals and interfering tones; AGC (automatic gain control) simulation.
Keywords
UHF power amplifiers; automatic gain control; circuit simulation; intermodulation distortion; modulators; phase locked loops; time-domain analysis; transient analysis; AGC; Circuit Envelope simulator; I-Q modulator simulations; IQ modulators; PLL simulations; UHF power amplifiers; adjacent-channel power ratio; amplifier adjacent-channel power ratio; automatic gain control loops; baseband modulation signals; baseband-to-RF signal mapping; communications circuits; digitally-modulated RF signals; digitally-modulated signals; envelope simulator; error vector magnitude; interfering tones; intermodulation distortion; modulated signals; power added efficiency; power-added efficiency; receiver simulation; reference oscillator feedthrough; sine wave inputs; time-domain noise simulation; transient RF signals; transient responses; Baseband; Circuit simulation; Circuits and systems; Error correction; Frequency; Gain control; Phase locked loops; Phase modulation; Power amplifiers; Radiofrequency amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location
Rohnert Park, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1998.768623
Filename
768623
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