DocumentCode :
2847113
Title :
A sub 1 /spl Omega/ load-pull quarter-wave pre-matching network based on a two-tier TRL calibration
Author :
Sevic, J.F.
Author_Institution :
Spectrian Corp., Sunnyvale, CA, USA
fYear :
1998
fDate :
3-4 Dec. 1998
Firstpage :
73
Lastpage :
81
Abstract :
Transistors used for cellular and PCS infrastructure applications are required to amplify signals with a peak-average ratio that can exceed 13 dB, resulting in a PEP approaching 1 kW. This PEP requirement is a consequence of simultaneous amplification of multiple digitally modulated carriers with a time-varying envelope, and requires a load resistance in the neighborhood of 0.3 /spl Omega/. Present load-pull technology, based on mechanical tuners, is limited to approximately 1 /spl Omega/ at cellular and PCS frequencies, which render these systems incapable of characterizing transistors under these conditions. Previously, many researchers have developed quarter-wave pre-matching networks to transform the source- and load-pull domains to a lower impedance. To characterize these quarter-wave networks, a variety of techniques have been used, including analytical characterization, full-wave characterization, and standard VNA error correction characterization. This paper presents a further refinement of the third approach, which is based on a two-tier calibration using 7 mm and micro-strip TRL calibrations. The accuracy of each tier is quantified by employing offset-short and delay standards to extract the source- and load-match error response. It is shown that from 0.85 GHz to 3.0 GHz forward and reverse source- and load-match are better than -45 dB and -52 dB, respectively. In conjunction with a Maury automated load-pull system, using MT981B tuners, an impedance of 0.10 /spl Omega/ at 1900 MHz is developed.
Keywords :
calibration; impedance matching; 0.10 ohm; 0.85 to 3.0 GHz; 1 kW; MT981B tuner; Maury automated system; PCS; PEP; RF power amplifier; VNA error correction; cellular base station; digital modulation; impedance matching; load pull; quarter-wave pre-matching network; systematic error; transistor; two-tier micro-strip TRL calibration; wireless infrastructure; Calibration; Delay; Error correction; Frequency; Impedance; Java; Personal communication networks; Power generation; Time varying systems; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1998.768627
Filename :
768627
Link To Document :
بازگشت