Title :
Integrating system level design and instrumentation for communications development
Author_Institution :
Microwave Instrum. Div., Hewlett-Packard Co., Santa Rosa, CA, USA
Abstract :
A challenge for communication system designers is to integrate many hardware subsystems. After a system has been modeled in software it has to be transferred to a hardware prototype. Linking electronic design automation (EDA) tools with measurement equipment decreases the time needed to evaluate and troubleshoot the system. This is accomplished by allowing subsystems to be tested as if they were part of the entire system even before the entire system is transferred to a hardware prototype. In this paper we describe this software/hardware link between the EDA tools and measurement equipment using the HP W-CDMA design library, HP 89441 A vector signal analyzer and HP ESG-D RF digital signal generator. In doing this we are also able to describe this solution´s application as a flexible waveform generator. A wide variety of signals can be simulated using the HP Advanced Design System (ADS) and the HP W-CDMA design library, with this software/hardware link these signals can now be turned into real world signals generated by the HP ESG-D RF digital signal generator. This includes baseband signals, RF signals, and also signals with channel impairments such as, fading, phase noise, IQ gain imbalance, and amplifier non-linearities.
Keywords :
automatic test equipment; electronic design automation; fading; phase noise; radiocommunication; telecommunication computing; telecommunication equipment testing; waveform generators; EDA tools; HP 89441 A vector signal analyzer; HP Advanced Design System; HP ESG-D RF digital signal generator; HP W-CDMA design library; IQ gain imbalance; RF signals; amplifier nonlinearities; baseband signals; channel impairments; communication system design; communications development; electronic design automation; fading; flexible waveform generator; hardware subsystems; instrumentation; measurement equipment; phase noise; software/hardware link; system level design; system troubleshooting; Electronic design automation and methodology; Hardware; Instruments; Multiaccess communication; RF signals; Signal design; Signal generators; Software libraries; Software prototyping; System-level design;
Conference_Titel :
ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics. 52nd
Conference_Location :
Rohnert Park, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1998.768635