Title :
Modeling and diagnosis of timed discrete event systems-a factory automation example
Author :
Chen, Yi-Liang ; Provan, Gregory
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Detection and identification of failures is a critical task in the automatic control of large and complex systems. In the realm of discrete event systems, Sampath et al. (1995, 1996) proposed a new approach to failure diagnosis that models the logical behavior of the considered system in terms of state machines and produces an extended observer called a diagnoser for computing diagnoses. We extend this approach to the diagnosis of timed discrete event systems whose temporal and logical behavior are modeled by a framework proposed by Brandin and Wonham (1994). We use a simple real-world factory conveyor example to demonstrate our modeling and diagnosis approach
Keywords :
automata theory; conveyors; discrete event systems; factory automation; state estimation; temporal logic; diagnoser; extended observer; factory automation; factory conveyor; failure diagnosis; failures detection; failures identification; logical behavior; state machines; timed discrete event systems; Application software; Automatic control; Communication networks; Computer networks; Delay; Discrete event systems; Event detection; Manufacturing automation; Production facilities; Timing;
Conference_Titel :
American Control Conference, 1997. Proceedings of the 1997
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-3832-4
DOI :
10.1109/ACC.1997.611749