DocumentCode
2847564
Title
ACO-based scheduling for a single Batch Processing Machine in semiconductor manufacturing
Author
Li, Li ; Qiao, Fei
Author_Institution
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai
fYear
2008
fDate
23-26 Aug. 2008
Firstpage
85
Lastpage
90
Abstract
This research is motivated by the scheduling problem in the diffusion and oxidation operations of semiconductor wafer fabrication facilities (fabs), where one machine is modeled as a single batch processing machine. The objective is to minimize the total weighted tardiness (TWT) on a single batch processing machine (BPM) with incompatible lot families and dynamic lot arrivals, with consideration on the sequence-dependent setup time. Since the problem is NP-hard, ant colony optimization (ACO) is used to achieve a satisfactory solution in a reasonable computation time. Extensive experiments have been implemented to validate and verify the proposed method. It is shown by the simulation results that the proposed method is superior to the common apparent tardiness cost- batched apparent tardiness cost (ATC-BATC) rule with smaller TWT and makespan, especially TWT that is improved by 40.07% on average.
Keywords
batch processing (industrial); integrated circuit manufacture; minimisation; semiconductor device manufacture; single machine scheduling; NP-hard problem; ant colony optimization-based scheduling; semiconductor manufacturing; semiconductor wafer fabrication facility; sequence-dependent setup time; single batch processing machine; total weighted tardiness minimization; Ant colony optimization; Dynamic scheduling; Fabrication; Job shop scheduling; Manufacturing automation; Manufacturing processes; Oxidation; Processor scheduling; Scheduling algorithm; Semiconductor device manufacture; ACO; Batch Processing Machine (BPM); Scheduling; Semiconductor Manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering, 2008. CASE 2008. IEEE International Conference on
Conference_Location
Arlington, VA
Print_ISBN
978-1-4244-2022-3
Electronic_ISBN
978-1-4244-2023-0
Type
conf
DOI
10.1109/COASE.2008.4626455
Filename
4626455
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