Title :
Electronically-tunable narrow-band noise source
Author_Institution :
Stanford Electronics Labs., Stanford, Calif., USA
Abstract :
A new narrow-bandwidth noise generator that can be electronically tuned over a wide frequency range has been developed. The device is based on the frequency-selective power-limiting characteristic of YIG materials.
Keywords :
Density measurement; Displays; Frequency; Microwave measurements; Narrowband; Noise figure; Noise generators; Noise level; Noise measurement; Oscillators;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1969.1154713
