DocumentCode :
2848034
Title :
Matching performance of dielectric covered finite microstrip phased array antennas
Author :
Hancock, G.D. ; King, A.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruices, NM, USA
fYear :
1990
fDate :
7-11 May 1990
Firstpage :
1770
Abstract :
The design of microstrip radiators is often complicated by the inability to predict the effects of dielectric covers required to protect the microstrip patches from environmental conditions or to match the array for wide-angle scanning. The effects of a dielectric cover on the wide-angle scan matching performance of a finite phased array of rectangular microstrip patches are examined. The approach used is to generate a spectral domain moment method formulation of a dielectric-covered finite phased array composed of rectangular microstrip patches, solve for the patch currents, and calculate the reflection coefficients. Graphs are included of reflection coefficient magnitudes versus E- and H-plane scan angle for a 7*7 patch array with a low dielectric constant substrate for various superstrate heights.<>
Keywords :
antenna accessories; antenna phased arrays; dielectric materials; impedance matching; microstrip antennas; microwave antenna arrays; scanning antennas; E-plane scan angle; H-plane scan angle; dielectric cover; dielectric covers; environmental protection; finite phased array; graphs; impedance matching; low dielectric constant substrate; microstrip phased array antennas; microstrip radiators; patch currents; rectangular microstrip patches; reflection coefficient magnitudes; scan matching performance; spectral domain moment method; wide angle scan matching; Dielectrics; Geometry; Impedance; Microstrip antenna arrays; Microstrip antennas; Moment methods; Phased arrays; Protection; Reflection; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1990. AP-S. Merging Technologies for the 90's. Digest.
Conference_Location :
Dallas, TX, USA
Type :
conf
DOI :
10.1109/APS.1990.115473
Filename :
115473
Link To Document :
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