• DocumentCode
    2848221
  • Title

    Optimal input design for indentation-based rapid broadband nanomechanical spectroscopy: Poly(dimethylsiloxane) example

  • Author

    Zhonghua Xu ; Qingze Zou

  • Author_Institution
    Mech. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2011
  • fDate
    June 29 2011-July 1 2011
  • Firstpage
    2272
  • Lastpage
    2277
  • Abstract
    This article presents an optimal input design approach to achieve rapid broadband nanomechanical measurements of soft materials using the indentation-based method. The indentation-based nanomechanical measurement provides unique quantifications of material properties at specified locations. The measurements, however, are currently too slow in time and too narrow in frequency (range) to characterize time-elapsing material properties during dynamic evolutions (e.g., the rapid-stage of the crystallization process of polymers). Such limits exist because the input force profiles used in current approaches cannot rapidly excite broadband nanomechanical properties of materials. In this article, we develop an optimal-input design approach to tackle these challenges. Particularly, an input force profile with discrete spectrum is optimized to maximize the Fisher information matrix of the linear compliance model of the soft material. Both simulation and experimental results on a PDMS sample are presented to illustrate the need for optimal input design, and its efficacy in probe-based nanomechanical property measurements.
  • Keywords
    crystallisation; nanoindentation; polymers; Fisher information matrix; PDMS sample; discrete spectrum; indentation-based rapid broadband nanomechanical spectroscopy; input force profile; linear compliance model; poly(dimethylsiloxane); polymer crystallization process; probe-based nanomechanical property measurements; soft materials; time-elapsing material property; Current measurement; Dynamics; Force; Force measurement; Frequency measurement; Materials; Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2011
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-0080-4
  • Type

    conf

  • DOI
    10.1109/ACC.2011.5990874
  • Filename
    5990874